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1 field-free ion source
Англо-русский словарь промышленной и научной лексики > field-free ion source
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2 ионный источник без магнитного поля
Русско-английский физический словарь > ионный источник без магнитного поля
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3 ионный источник без магнитного поля
Makarov: field-free ion sourceУниверсальный русско-английский словарь > ионный источник без магнитного поля
См. также в других словарях:
Ion source — An ion source is an electro magnetic device that is used to create charged particles. These are used primarily within mass spectrometers or particle accelerators.Mass spectrometry In mass spectrometry, an ion source is a piece of equipment used… … Wikipedia
Field electron emission — It is requested that a diagram or diagrams be included in this article to improve its quality. For more information, refer to discussion on this page and/or the listing at Wikipedia:Requested images. Field emission (FE) (also known as field… … Wikipedia
Field-effect transistor — FET redirects here. For other uses, see FET (disambiguation). High power N channel field effect transistor The field effect transistor (FET) is a transistor that relies on an electric field to control the shape and hence the conductivity of a… … Wikipedia
Ion Negoiţescu — Born August 10, 1921(1921 08 10) Cluj Died February 6, 1993(1993 02 06) (aged 71) Munich Pen name … Wikipedia
Ion Creangă — Creangă redirects here. For other uses, see Creangă (surname). Ion Creangă Nică al lui Ştefan a Petrei Ion Torcălău Ioan Ştefănescu Born 1837 or 1839 Târgu Neamţ Died … Wikipedia
Field emission display — A field emission display (FED) is a display technology that incorporates flat panel display technology that uses large area field electron emission sources to provide electrons that strike colored phosphor to produce a color image as a electronic … Wikipedia
Secondary ion mass spectrometry — Infobox chemical analysis name = Secondary ion mass spectrometry caption =CAMECA IMS3f Magnetic SIMS Instrument acronym = SIMS classification =Mass spectrometry analytes = Solid surfaces, thin films related = Fast atom bombardment… … Wikipedia
Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… … Wikipedia
Fourier transform ion cyclotron resonance — Infobox chemical analysis name = Fourier transform ion cyclotron resonance caption =A FTMS instrument at the Pacific Northwest National Laboratory, USA acronym = FTMS, FTICR classification =Mass spectrometry analytes = manufacturers = related =… … Wikipedia
Reactive-ion etching — (RIE) is an etching technology used in microfabrication. It uses chemically reactive plasma to remove material deposited on wafers. The plasma is generated under low pressure (vacuum) by an electromagnetic field. High energy ions from the plasma… … Wikipedia
Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… … Wikipedia